Mehdi Adelifard obtained his Ph.D. in solid state physics from Shahrood University of technology on Septemer 2012, based on ”An investigation on physical properties of thin films and nanostructures in chalcogenide compound semiconductors”. Here, he was involved in the characterization of CuS, CuS-ZnS (CZS) binary and Cu2SnS3 (CTS) ternary semiconductors by means of XRD, FESEM, UV.Vis-NIR spectrophotometer, Hall effect setup and solar cell analyzer. Mehdi Adelifard has authored or co-authored over 20 publications in national and international journals or conference proceedings.
Solid State Physics
Shahrood University of Technology, Shahrood, Iran
Solid States Physics
Ferdowsi University of Mashhad, Mashhad, Iran
Shiraz University, Shiraz, Iran
Nanophysics and nanotechnology devices (Graduate courses)
INDEX KEYWORDS: Layered semiconductors; Molybdenum oxide; Optical data processing; Semiconducting films; Spray pyrolysis; Substrates; Sulfur; X ray diffraction analysis, Hexagonal structures; Optical and electrical properties; Optical measurement; P type conductivity; Reflectance spectrum; Spray-pyrolysis techniques; Sulfur concentrations; Thermoelectric measurements, Thin films PUBLISHER: Springer New York LLC
INDEX KEYWORDS: Energy gap; Hole mobility; Semiconducting films; Solar cells; Spray pyrolysis; X ray diffraction; Zinc, Absorption co-efficient; Optical and electrical properties; Optical band gap energy; Precursor solutions; Solar-cell applications; Spray-pyrolysis techniques; Transmittance and reflectances; X-ray diffraction measurements, Film growth PUBLISHER: Springer New York LLC
INDEX KEYWORDS: Absorption coefficients; Compositional analysis; Covellite; Deposited layer; Field emission scanning electron microscopy; Hexagonal crystal structure; Molar ratio; Optical measurement; P type semiconductor; Photovoltaic applications; Spray-pyrolysis techniques; Ternary phase; Ternary semiconductors; Tin sulfide; Visible spectra, Electric properties; Energy dispersive spectroscopy; Field emission microscopes; Optical data processing; Spray pyrolysis; Sulfide minerals; Thin films; Tin; X ray diffraction, Copper
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