
T (+98) 23 352 20220
Email: international@du.ac.ir
Damghan University
University Blvd, Damghan, IR
Associate Professor of Condensed Matter Physics
DOI: 10.1016/j.ceramint.2018.08.171
AUTHOR KEYWORDS: Electrochemical performance; La2-xSrxCoO4; Solid oxide fuel cell; Symmetrical cell
INDEX KEYWORDS: Cathodes; Charge transfer; Dissociation; Electric conductivity; Electrochemical impedance spectroscopy; Lanthanum compounds; Oxygen; Sol-gel process; Sol-gels; Stability; Strontium; Strontium compounds; X ray diffraction, Electrical conductivity measurements; Electrochemical characterizations; Electrochemical investigations; Electrochemical performance; La2-xSrxCoO4; Nearest neighbor hopping; Specific polarization resistances; Symmetrical cells, Solid oxide fuel cells (SOFC)
PUBLISHER: Elsevier Ltd
DOI: 10.1016/j.jmmm.2018.06.062
AUTHOR KEYWORDS: IR spectroscopy; Jahn-Teller distortion; Ruddlesden-Popper; Spin state; XRD
INDEX KEYWORDS: Bond length; Cobalt; FIR filters; Infrared spectroscopy; Jahn-Teller effect; Rietveld refinement; Sol-gel process; Sol-gels; Spin dynamics; X ray diffraction, Fir spectroscopies; Iodometric titration; IR absorption; Ruddlesden-Popper; Sol-gel routes; Spin state; Structural parameter; Vibration modes, Strontium
PUBLISHER: Elsevier B.V.
DOI: 10.1140/epjc/s10052-017-5338-z
PUBLISHER: Springer New York LLC
DOI: 10.1007/s10854-017-7293-8
INDEX KEYWORDS: Ammonia; Ammonium persulfate; Electron microscopy; Enamels; Energy gap; Ethylene; Ethylene glycol; Field emission microscopes; High resolution transmission electron microscopy; Molybdenum compounds; Molybdenum oxide; Nanoparticles; Scanning electron microscopy; Sols; Transmission electron microscopy; X ray diffraction analysis, Annealing temperatures; Chalcogenide semiconductors; Field emission scanning electron microscopy; Hexagonal structures; Molybdenum disulfide; Molybdenum sulfide; Porous nanoparticles; Synthesis and characterizations, Synthesis (chemical)
PUBLISHER: Springer New York LLC
DOI: 10.1007/s10854-016-6297-0
INDEX KEYWORDS: Carbon; Catalysts; Crystallite size; Graphite; High resolution transmission electron microscopy; Nanosheets; Scanning electron microscopy; Structural properties; Titanium dioxide; Transmission electron microscopy; X ray diffraction; Zinc oxide, AC arc discharge; Arc-discharge method; Catalytic growth; Few-layer graphene; Graphene sheets; Growth mechanisms; Multi-layered graphene sheets; Transmission electron, Graphene
PUBLISHER: Springer New York LLC
DOI: 10.1007/s00339-016-0719-y
INDEX KEYWORDS: Annealing; Electron microscopy; Enamels; Energy gap; Field emission microscopes; Fourier transform infrared spectroscopy; High resolution transmission electron microscopy; Layered semiconductors; Molybdenum; Molybdenum compounds; Nanoparticles; Nanostructures; Scanning electron microscopy; Sulfur; Synthesis (chemical); Transmission electron microscopy; X ray diffraction analysis, Annealing temperatures; Chalcogenide semiconductors; Characteristic bands; Chemical reduction methods; Field emission scanning electron microscopy; Hexagonal structures; Homogeneous distribution; Molybdenum disulfide, Molybdenum oxide
PUBLISHER: Springer Verlag
DOI: 10.1016/j.tsf.2016.11.040
AUTHOR KEYWORDS: Anatase; Band gap; Nanosized; Spray pyrolysis; Titanium dioxide
INDEX KEYWORDS: Energy gap; Nanocrystals; Optical properties; Oxides; Pyrolysis; Scanning electron microscopy; Substrates; Thick films; Thin films; Titanium; Titanium dioxide; X ray diffraction, Nanosized; Solution flow rate; Spray-pyrolysis techniques; Structural and optical properties; Substrate temperature; Thin and thick films; Titanium dioxide thin film; Visible transmittance, Spray pyrolysis
PUBLISHER: Elsevier B.V.
DOI: 10.1007/s10854-016-5128-7
INDEX KEYWORDS: Electron microscopy; Energy gap; Film preparation; Graphene; High resolution transmission electron microscopy; Optical films; Optical properties; Oxide films; Pyrolysis; Scanning electron microscopy; Semiconductor doping; Spray pyrolysis; Tin oxides; Transmission electron microscopy; X ray diffraction, Chemical reduction methods; Electrical and optical properties; Graphene composites; Hydrazine hydrate; Indium Tin Oxide films; Scanning electrons; Spray pyrolysis method; Systematic study, Composite films
PUBLISHER: Springer New York LLC
DOI: 10.1007/s10854-015-4026-8
INDEX KEYWORDS: Carrier concentration; Crystal impurities; Crystal orientation; Energy gap; Fluorine; Nanocrystals; Photoconductivity; Semiconductor doping; Spray pyrolysis; Substrates; Thin films, Atomic concentration; Compositional analysis; Hall effect measurement; Nanocrystalline particle; Photoconductive properties; Spray-pyrolysis techniques; Tetragonal crystal structure; Thermoelectric properties, Conductive films
PUBLISHER: Springer New York LLC
Poorali, M.-S., Bagheri-Mohagheghi, M.-M. Comparison of chemical and physical reduction methods to prepare layered graphene by graphene oxide: optimization of the structural properties and tuning of energy band gap
(2016) 27 (1), pp. 260-271.
DOI: 10.1007/s10854-015-3749-x
INDEX KEYWORDS: Argon; Band structure; Emission spectroscopy; Energy gap; Fourier transform infrared spectroscopy; Graphene; Heat treatment; Hydration; Hydrazine; Ionization of gases; Nanosheets; Structural optimization, Application method; Chemical reduction methods; Electronically excited state; Hole recombination; Hydrazine hydrate; Physical methods; Reduction method; Sodium boro hydrides, Structural properties
PUBLISHER: Springer New York LLC
DOI: 10.1080/09205071.2015.1050528
AUTHOR KEYWORDS: Fluorine doped tin oxide (FTO); Microstrip antenna; Spray pyrolysis; Transparent antenna
INDEX KEYWORDS: Antenna grounds; Film thickness; Fluorine; Microwave antennas; Nanocomposites; Slot antennas; Spray pyrolysis; Tin; Tin oxides; Transfer matrix method; Transparency, Deposited films; Fluorine doped tin oxide; Micro-strip patch antennas; Optical transparency; Resonance frequencies; Spray-pyrolysis techniques; Substrate thickness; Transparent conductors, Microstrip antennas
PUBLISHER: Taylor and Francis Ltd.
DOI: 10.1016/j.mssp.2014.10.049
AUTHOR KEYWORDS: FTO; Phosphorus; Semiconductor thin films; Spray pyrolysis
INDEX KEYWORDS: Carrier concentration; Conductive films; Crystal orientation; Crystal structure; Doping (additives); Oxide films; Phosphorus; Photoconductivity; Substrates; Thin films; Tin oxides; X ray diffraction, Compositional analysis; FTO; Hall effect measurement; Photoconductive properties; Semiconducting thin films; Semiconductor thin films; Spray-pyrolysis techniques; Tetragonal crystal structure, Spray pyrolysis
PUBLISHER: Elsevier Ltd
DOI: 10.1049/iet-map.2015.0048
INDEX KEYWORDS: Antenna grounds; Copper; Descaling; Directional patterns (antenna); Fluorine; Microstrip devices; Microwave antennas; Nanocomposites; Slot antennas; Spray pyrolysis; Substrates; Tin; Tin oxides, Conventional conductors; Fluorine doped tin oxide; Micro-strip patch antennas; Proximity couplings; Radiation properties; Resonance frequencies; Spray-pyrolysis techniques; Transparent layers, Microstrip antennas
PUBLISHER: Institution of Engineering and Technology
DOI: 10.1016/j.mssp.2014.12.049
AUTHOR KEYWORDS: Fluorine dopant; Nanostructure; Thin film; Vanadium oxide
INDEX KEYWORDS: Amorphous materials; Cyclic voltammetry; Doping (additives); Electromagnetic wave absorption; Energy gap; Fluorine; Light absorption; Nanostructures; Optical properties; Oxides; Scanning electron microscopy; Spray pyrolysis; Substrates; Thin films; Ultraviolet visible spectroscopy; Vanadium; X ray diffraction, Dopant concentrations; Nanostructured thin film; Preferred orientations; Spray pyrolysis method; Structural and optical properties; Substrate temperature; UV visible spectroscopy; Vanadium oxides, Semiconductor doping
PUBLISHER: Elsevier Ltd
DOI: 10.3139/146.111120
AUTHOR KEYWORDS: Copper and sulfide doping; Nanostructures; Spray pyrolysis; Thin films; Tin oxide
INDEX KEYWORDS: Copper; Doping (additives); Nanostructures; Optical data processing; Optical properties; Oxide films; Semiconductor doping; Substrates; Thin films; Tin oxides, Cu concentrations; Dopant concentrations; Effect of coppers; Experimental evidence; Nanostructured thin film; Optical measurement; Polycrystalline layers; Spray-pyrolysis techniques, Spray pyrolysis
PUBLISHER: Carl Hanser Verlag
DOI: 10.1088/0031-8949/88/06/065701
INDEX KEYWORDS: Cyclic voltammograms; Electrochemical measurements; Oxide coated glass; Preferred orientations; Scanning electron microscopy image; Spray-pyrolysis techniques; Vanadium oxide thin films; X ray diffractometers, Electric properties; Electrochemical properties; Film preparation; Glass; Nanobelts; Oxides; Scanning electron microscopy; Spray pyrolysis; Substrates; Thin films, Semiconductor doping
DOI: 10.1155/2013/791641
INDEX KEYWORDS: Alumina Nanoparticle; Aluminum nitrate; Annealing temperature effects; Annealing temperatures; Complexing agents; FTIR spectroscopy; High temperature; Polymeric precursors, Alumina; Citric acid; Metabolism; Nanoparticles; Particle size; Sol-gel process; Structural properties; Urea, Synthesis (chemical)
DOI: 10.1088/1674-4926/34/10/103001
AUTHOR KEYWORDS: cycle voltammogram; optical properties; thin films; vanadium oxide
INDEX KEYWORDS: Electrochromic properties; Optical transparency; Solution concentration; Spray-pyrolysis techniques; Vanadium oxide films; Vanadium oxide thin films; Vanadium oxides; Voltammograms, Electric properties; Optical properties; Oxide films; Oxides; Scanning electron microscopy; Spray pyrolysis; Substrates; Thin films; Ultraviolet visible spectroscopy; X ray diffraction, Film preparation
DOI: 10.1142/S0217984913501522
AUTHOR KEYWORDS: cycle voltammogram; electrical properties; structural; thin films; Vanadium oxide
DOI: 10.1088/1674-4926/34/8/082001
AUTHOR KEYWORDS: optical band gap; spray pyrolysis; thin film; tin selenide
INDEX KEYWORDS: Alcoholic solutions; Helium ion microscopies; Polycrystalline structure; Scanning electrons; Selenium concentrations; Spray-pyrolysis techniques; Tin selenides; UV-vis spectroscopy, Chlorine compounds; Optical band gaps; Scanning electron microscopy; Scanning tunneling microscopy; Semiconducting selenium compounds; Spray pyrolysis; Substrates; Thin films; Tin; Ultraviolet visible spectroscopy; X ray diffraction, Film preparation
DOI: 10.1016/j.tsf.2013.03.047
AUTHOR KEYWORDS: In2S3 thin films Tin doping Photoconductive properties Thermoelectric properties Spray pyrolysis
INDEX KEYWORDS: Band-gap values; Glass substrates; Hall effect measurement; N-type conductivity; Photoconductive properties; Scanning electron microscopy image; Spray solutions; Spray-pyrolysis techniques, Deposits; Electric properties; Indium; Optical correlation; Photoconductivity; Scanning electron microscopy; Spray pyrolysis; Substrates; Thin films; Tin; X ray diffraction analysis, Film preparation
DOI: 10.1007/s10971-012-2940-2
AUTHOR KEYWORDS: Complexing agent; Nanoparticles; Sol-gel process; TiO2
INDEX KEYWORDS: Acetyl acetone; Anatase phase; BET surface area; Complexing agents; Effect of complexing agents; Structural and optical properties; TiO; UV-vis spectroscopy, Acetone; Nanoparticles; Oxide minerals; Sol-gel process; Synthesis (chemical); Ultraviolet visible spectroscopy, Titanium dioxide
DOI: 10.1007/s40436-013-0018-1
AUTHOR KEYWORDS: Co-precipitation; Nanoparticles; sol-gel
PUBLISHER: springer berlin
DOI: 10.1007/s40436-013-0045-y
AUTHOR KEYWORDS: Optical properties; Spray pyrolysis; Thin films; Vanadium oxide
PUBLISHER: springer berlin
DOI: 10.1088/0031-8949/86/05/055701
INDEX KEYWORDS: Atomic ratio; Band-gap values; Deposited films; Glass substrates; Hall effect measurement; N-type conductivity; Photoconductive properties; SEM image; Spray solutions; Spray-pyrolysis techniques; Sulfur impurities, Atoms; Deposits; Electric properties; Indium; Photoconductivity; Semiconductor doping; Spray pyrolysis; Substrates; Sulfur; Thin films; X ray diffraction analysis, Film preparation
DOI: 10.1016/j.tsf.2012.06.075
AUTHOR KEYWORDS: Microstructure; Optical properties; P-type conductivity; Spray pyrolysis; Sulfur doping; Thin films; Tin oxide
INDEX KEYWORDS: Al content; Al-concentration; Atomic ratio; Band-gap values; Co-doped SnO; Grain size; Hall effect measurement; Majority carriers; Minimum resistance; P-type conductivity; Photoconductive properties; S-doped; Semiconductor thin films; Small crack; Spray solutions; Sulfur doping; Thermoelectric measurements, Aluminum; Electric properties; Microstructure; Optical properties; Photoconductivity; Scanning electron microscopy; Spray pyrolysis; Sulfur; Thin films; Tin; Tin oxides; X ray diffraction analysis, Semiconductor doping
DOI: 10.1166/jnn.2012.5155
AUTHOR KEYWORDS: DC Magnetometry; Diluted Magnetic Semiconductors; Ferromagnetism in Semiconductor; Sol-Gel Process; X-ray Diffraction
INDEX KEYWORDS: Annealing condition; Annealing temperatures; Average grain size; Cluster sizes; Co-doped; DC Magnetometry; Diluted magnetic semiconductors; Metallic phase; Paramagnetic behavior; Structural and magnetic properties; TiO; TiO2 nano-particles, Annealing; Cobalt compounds; Magnetic properties; Magnetic semiconductors; Magnetometers; Nanoparticles; Paramagnetism; Synthesis (chemical); Titanium dioxide; X ray diffraction, Sol-gel process
DOI: 10.1007/s12043-011-0257-2
AUTHOR KEYWORDS: Spray pyrolysis; Thin films; X-ray diffraction; ZnO
INDEX KEYWORDS: Deposition Parameters; Electrical measurement; Glass substrates; NIR spectroscopy; Optimal parameter; Polycrystalline wurtzite; Solution volume; Spray pyrolysis deposition; Spray pyrolysis method; Substrate temperature; Visible range; XRD patterns; ZnO; ZnO thin film, Deposition; Deposition rates; Metallic films; Optical films; Scanning electron microscopy; Spray pyrolysis; Substrates; Thin films; Vapor deposition; X ray diffraction; Zinc oxide; Zinc sulfide, Film preparation
DOI: 10.1088/0031-8949/85/01/015703
INDEX KEYWORDS: Al-doping; Aluminum concentration; Atomic ratio; Doping levels; Glass substrates; Hall effect measurement; Majority carriers; N-type conduction; P-Type conduction; Polycrystalline; Spray pyrolysis method; Spray-pyrolysis techniques; Transparent conducting films, Aluminum; Conductive films; Electric properties; Hall effect; Photoconductivity; Sheet resistance; Spray pyrolysis; Substrates; Tin; X ray diffraction analysis, Semiconductor doping
DOI: 10.1088/1674-4926/32/11/113002
AUTHOR KEYWORDS: photoconductivity; spray pyrolysis; thin film; tin sulfide
INDEX KEYWORDS: Atomic ratio; Deposition conditions; Deposition Parameters; Glass substrates; Measurement results; Mole ratio; Optical gap; Polycrystalline structure; Precursor solutions; Spray solutions; Spray-pyrolysis techniques; Substrate temperature; Tin chlorides; tin sulfide; UV-vis spectroscopy; XRD patterns, Amorphous films; Amorphous materials; Chlorine compounds; Electric properties; Film preparation; Photoconductivity; Scanning electron microscopy; Substrates; Thin films; Thioureas; Tin; Tinning; Ultraviolet spectroscopy; Ultraviolet visible spectroscopy; Vapor deposition; X ray diffraction, Spray pyrolysis
DOI: 10.1007/s12043-011-0135-y
AUTHOR KEYWORDS: Hydrothermal method; Sol-gel method; ZnO nanoparticles
INDEX KEYWORDS: Complexing agents; Crystallization process; Decomposition temperature; Effect of complexing agents; Gel method; Hydrothermal methods; Oxalic Acid; Sol-gel methods; STEM images; Structural and optical properties; XRD patterns; ZnO; ZnO nanoparticles, Crystallization; Gels; Metabolism; Optical properties; Organic acids; pH effects; Sol-gel process; Sol-gels; Sols; Ultraviolet spectroscopy; Urea; Zinc oxide, Nanoparticles
DOI: 10.1088/0031-8949/84/03/035705
INDEX KEYWORDS: Alcoholic solutions; Atomic ratio; Energy dispersive x-ray; Glass substrates; Helium ion; High temperature range; Optical gap; Polycrystalline structure; Preferred orientations; Semiconductor thin films; Spray-pyrolysis techniques; Thermal activation energies; Thermoelectric properties; Tin chlorides; Tin sulfide; UV-vis spectroscopy, Activation energy; Chlorine compounds; Crystal orientation; Helium; Light sensitive materials; Optical films; Photoconductivity; Photoelectricity; Photosensitivity; Scanning electron microscopy; Spray pyrolysis; Substrates; Thermoelectric equipment; Thermoelectricity; Thin films; Thioureas; Tin; Ultraviolet spectroscopy; Urea; X ray diffraction; X ray diffraction analysis, Film preparation
DOI: 10.1088/0031-8949/84/03/035801
INDEX KEYWORDS: Anti-bacterial activity; Antibacterial properties; Dopant concentrations; Drop test; Glass substrates; Hexagonal wurtzite structure; Mg concentrations; Mg-doping; Morphological study; Optical study; Scanning electrons; Secondary phase; Spray-pyrolysis techniques; Uniform films; UV-vis spectroscopy; ZnO, Deposition; Escherichia coli; Magnesium printing plates; Scanning electron microscopy; Scanning tunneling microscopy; Spray pyrolysis; Substrates; Thin films; Ultraviolet spectroscopy; Vapor deposition; X ray diffraction analysis; Zinc oxide; Zinc sulfide, Semiconductor doping
DOI: 10.1088/0031-8949/84/03/035702
INDEX KEYWORDS: Acetyl acetone; AFM; Antiferromagnetic interaction; Blocking temperature; Complex agent; Ni-doped; Structural and magnetic properties; Structural composition; Structural phasis; TiO; Titanium Isopropoxide; Type structures; XRD; Zero-field-cooled, Acetone; Antiferromagnetism; Citric acid; Gels; Magnetic properties; Nanoparticles; Oxide minerals; Polymers; Sol-gel process; Sol-gels; Sols; Titanium; Titanium dioxide; X ray diffraction, Titanium compounds
DOI: 10.1016/j.jallcom.2010.11.075
AUTHOR KEYWORDS: Lithium doping; Nickel oxide; Spray pyrolysis; Transparent conducting oxides
INDEX KEYWORDS: Alloy film; Cubic structure; Deposition Parameters; Doping levels; Electrical measurement; Glass substrates; Initial solution; Lithium doping; Lithium oxides; NiO thin film; Optical transparency; P-type conductivity; Spray-pyrolysis techniques; Substrate temperature; Transparent conducting films; Transparent conducting oxide; XRD, Alloys; Carrier concentration; Conductive films; Electric properties; Film preparation; Lithium; Lithium alloys; Metallic films; Nickel; Nickel oxide; Optical films; Oxide films; Semiconducting films; Semiconducting glass; Structural analysis; Substrates; Thin films; Vapor deposition, Spray pyrolysis
DOI: 10.1088/0031-8949/83/01/015801
INDEX KEYWORDS: Chemical additive; Control procedures; Effective parameters; Growth control; Relative importance; Thermal decompositions; ZnO nanoparticles, Nanoparticles; Pyrolysis; Zinc oxide, Activity coefficients
DOI: 10.1016/j.physe.2010.06.019
INDEX KEYWORDS: Bi-layer; I-V measurements; Measurement results; Middle layer; Post annealing; Reverse breakdown voltage; Spray-pyrolysis techniques; Transparent semiconducting oxide; ZnO, Annealing; Electric breakdown; Heterojunctions; Zinc oxide, Spray pyrolysis
DOI: 10.1016/j.physe.2010.08.028
INDEX KEYWORDS: Annealing temperatures; Burstein-Moss effects; Crystallinities; Cubic phase; Direct band gap; Energy bandgaps; Hydroalcoholic solution; Indium tin oxide; Micro-structural; Nano powders; Nanocrystallines; Optical absorption measurement; Post-annealing temperature; Sol-gel methods; TEM; TEM images; Temperature range; XRD patterns, Annealing; Carrier concentration; Citric acid; Crystalline materials; Energy gap; Ethylene; Ethylene glycol; Indium; Indium compounds; Nanoparticles; Powders; Tin; Tin oxides; Transmission electron microscopy; X ray diffraction; X ray powder diffraction, Optical properties
DOI: 10.1016/j.physb.2010.06.067
AUTHOR KEYWORDS: Cobalt doping; P-type conductivity; Spray pyrolysis; Transparent semiconducting films
INDEX KEYWORDS: Cobalt; Doping (additives); Electromagnetic wave absorption; Light absorption; Metallic films; Oxide films; Pyrolysis; Seebeck coefficient; Semiconductor doping; Spray pyrolysis; Substrates; Thin films; Tin; Tin oxides; X ray diffraction, Aqueous ethanol solutions; Cobalt doping; Electrical , optical and structural properties; Optical transmittance spectrum; P type conductivity; Spray-pyrolysis techniques; Thermo-electrical characterization; X-ray diffraction studies, Semiconducting films
PUBLISHER: Elsevier B.V.
DOI: 10.1016/j.physe.2009.06.009
AUTHOR KEYWORDS: Characterization; Hydro-thermal technique; Indium oxide; Nano-particles; Sol-gel technique
INDEX KEYWORDS: Blue shift; Cubic phase; Direct band gap; Hexagonal phase; Hydro-thermal technique; Hydroalcoholic solution; Indium nitrate; Indium oxide; Nano powders; Nanocrystallines; Needle-like; Particle size reduction; SEM; Sol-gel methods; Sol-gel technique; Spherical shape; Surface area; Synthesis route; TEM; Thermal methods; Thermal techniques, Gelation; Gels; Hydrates; Indium; Indium compounds; Nanoparticles; Scanning electron microscopy; Sol-gels; Sols; Structural analysis; Synthesis (chemical); Transmission electron microscopy; X ray diffraction; X ray powder diffraction, Sol-gel process
DOI: 10.1016/j.solidstatesciences.2008.05.005
AUTHOR KEYWORDS: Iron (Fe) doping; p-Type conductivity; Spray pyrolysis; Thermoelectric power; Tin oxide
INDEX KEYWORDS: Chemical reactions; Conductive films; Doping (additives); Electric resistance; Galvanomagnetic effects; Hall effect; Iron oxides; Magnetic field effects; Metallic films; Optical conductivity; Optical films; Oxide films; Pesticides; Pyrolysis; Scanning electron microscopy; Seebeck coefficient; Semiconducting films; Thermogravimetric analysis; Tin; Titanium compounds; X ray analysis; X ray diffraction analysis, Characteristic peaks; Conductivity properties; Doping levels; Electrical resistivities; Nonlinear behaviors; Optical transparencies; Optical-; p-Type conductivity; Polycrystalline structures; Pyrolysis techniques; Temperature differences; Temperature ranges; Tin oxide films; X-ray diffractions, Spray pyrolysis
DOI: 10.1016/j.physb.2008.01.004
AUTHOR KEYWORDS: Annealing temperature; Nano-particle; Sol-gel method; Tin oxide
INDEX KEYWORDS: Complexation; Polymerization; Rapid thermal annealing; Sol-gel process; Tin oxides; Transmission electron microscopy; X ray diffraction, Annealing temperature; Hydro-alcoholic solution; Polymerization agents, Nanoparticles
DOI: 10.1088/0268-1242/19/6/019
INDEX KEYWORDS: Electric properties; Glass; Hall effect; Heterojunctions; Light absorption; Light emitting diodes; Lithium; Pyrolysis; Semiconductor doping; Thin films; X ray diffraction analysis, Conducting films; Spray pyrolysis; Transparent electronics, Tin compounds
DOI: 10.1088/0022-3727/37/8/014
INDEX KEYWORDS: Aluminum compounds; Chemical sensors; Doping (additives); Electric conductivity; Electromagnetic shielding; Energy gap; Flat panel displays; Hall effect; Light absorption; Opacity; Optoelectronic devices; Pyrolysis; Substrates; Thermodynamic stability; Thin films; X ray diffraction, Optical transparency; Spray pyrolysis; Transparent conducting films; Transparent conducting oxides (TCOs), Tin compounds
DOI: 10.1016/S0040-6090(03)00948-9
AUTHOR KEYWORDS: Spray pyrolysis; Tin oxide; Transparent conducting oxide films; Zinc oxide
INDEX KEYWORDS: Composition; Electric conductivity; Hall effect; Pyrolysis; Scanning electron microscopy; Solutions; Tin compounds; Zinc oxide, Spray pyrolysis, Thin films
DOI: 10.1088/0268-1242/18/2/306
INDEX KEYWORDS: Crystal lattices; Electric conductivity; Pyrolysis; Semiconducting indium compounds; Semiconductor doping; Transparency; X ray diffraction; Zinc, Dopants, Thin films